Technology News

Nanometrics Launches Overlay Metrology System

Friday, December 05, 2008 5:01:00 AM PDT | VentureDeal Staff

Milpitas, California  --  Metrology equipment maker Nanometrics (Nasdaq: NANO) announced the launch of a new overlay metrology solution for integrated circuit manufacturing operations.

Called the Caliper InSight, the system improves precision and throughput for overlay metrology solutions as far down as the 32 nm and 22 nm technology nodes.

"With the launch of the Caliper InSight, we continue to strengthen and expand product offerings in our core markets," commented Tim Stultz, president and chief executive officer of Nanometrics.

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